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Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors
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language: Inglese
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17883541
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relates: Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors

Article
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Inglese
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RDF description of Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors - http://irises.unimore.it/resource/item/13694
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date: 2026-08-13T03:25:37
publisher: Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors
type: Document