Experimental Characterization of Statistically Independent Defects in Gate Dielectrics - Part I: Description and Validation of the Model
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Academic Article
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relates: Experimental Characterization of Statistically Independent Defects in Gate Dielectrics - Part I: Description and Validation of the Model

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Generically Dependent Continuant
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Article
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Inglese
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date: 2026-08-13T03:25:36
publisher: Experimental Characterization of Statistically Independent Defects in Gate Dielectrics - Part I: Description and Validation of the Model
type: Document
label: RDF description of Experimental Characterization of Statistically Independent Defects in Gate Dielectrics - Part I: Description and Validation of the Model - http://irises.unimore.it/resource/item/176255