12320452
type: Entity
type: BFO_0000020
type: Authorship
type: Relationship
type: Continuant
type: Thing
relates: Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs

Document
type: Class

Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs
type: Generically Dependent Continuant
type: Academic Article
type: Continuant
type: Entity
related by: 12320452
type: Article
type: Document
most specific type: Academic Article
type: Thing
type: Information Content Entity
language: Inglese

Academic Article
type: Class

Continuant
type: Class

Entity
type: Class

Generically Dependent Continuant
type: Class

Article
type: Class

Information Content Entity
type: Class

Inglese
type: Language

RDF description of Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs - http://irises.unimore.it/resource/item/176285
rights: termsOfUse
date: 2026-08-13T03:25:37
publisher: Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs
type: Document