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Academic Article
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Inglese
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Degradation mechanisms induced by high current density in Al-gate GaAs MESFETs
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language: Inglese
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RDF description of Degradation mechanisms induced by high current density in Al-gate GaAs MESFETs - http://irises.unimore.it/resource/item/20787
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date: 2026-08-13T03:25:37
publisher: Degradation mechanisms induced by high current density in Al-gate GaAs MESFETs
type: Document