Document
type: Class

Academic Article
type: Class

Continuant
type: Class

Entity
type: Class

Generically Dependent Continuant
type: Class

Article
type: Class

Information Content Entity
type: Class

Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation
language: Inglese
type: Article
type: Continuant
type: Academic Article
type: Document
type: Generically Dependent Continuant
related by: 5123175
most specific type: Academic Article
type: Thing
type: Entity
type: Information Content Entity

Inglese
type: Language

RDF description of Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation - http://irises.unimore.it/resource/item/46658
rights: termsOfUse
date: 2026-08-13T03:25:37
publisher: Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation
type: Document

5123175
type: Entity
type: BFO_0000020
type: Authorship
type: Relationship
type: Continuant
type: Thing
relates: Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation