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Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs
related by: 6382064
type: Article
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language: Inglese
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most specific type: Academic Article

Continuant
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Generically Dependent Continuant
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Article
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6382064
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relates: Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs

Information Content Entity
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Inglese
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RDF description of Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs - http://irises.unimore.it/resource/item/5417
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date: 2026-08-13T03:25:36
publisher: Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs
type: Document