Document
Academic Article
Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs
Generically Dependent Continuant
Article
Information Content Entity
RDF description of Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs - http://irises.unimore.it/resource/item/5417