Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides
Contributo in Atti di convegno
Data di Pubblicazione:
2001
Citazione:
Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides / Esseni, D., Bude, J., Selmi, L.. - In: MICROELECTRONIC ENGINEERING. - ISSN 0167-9317. - 59:1-4(2001), pp. 55-60. (12th Biannual Conference on Insulating Films on Semi-Conductors (INFOS 2001) Udine, ita JUN 20-23, 2001) [10.1016/S0167-9317(01)00646-3].
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
oxide reliability; mechanisms of degradation; anode hole injection; oxide hole trapping; carrier separation experiments
Elenco autori:
Esseni, David; Bude, J; Selmi, Luca
Link alla scheda completa:
Titolo del libro:
MICROELECTRONIC ENGINEERING
Pubblicato in: