Si nanostructures embedded in SiO[sub 2]: electronic and optical properties
Contributo in Atti di convegno
Data di Pubblicazione:
2002
Citazione:
Si nanostructures embedded in SiO[sub 2]: electronic and optical properties / Ossicini, Stefano; Degoli, Elena; Luppi, Marcello; Magri, Rita. - STAMPA. - 4808:(2002), pp. 73-84. ( Optical Properties of Nanocrystals Seattle, WA, usa July 07, 2002) [10.1117/12.452043].
Abstract:
We present ab initio results for the structural, electronic and optical properties of silicon nanostructures confined by silicon dioxide. We investigate the role of the dimension, symmetry and bonding situations at the interfaces. In particular we consider Si/SiO2 superlattices and Si nanocrystals embedded in SiO2 matrix. In the case of Si/SiO2 superlattices the presence of oxygen defects at the interface and the dimensionality are the key points in order to explain the experimental outcomes concerning photoluminescence. For Si nanocrystals embedded in SiO2 we show, in agreement with experimental results, the close interplay between chemical and structural effects on the electronic and optical properties.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
Silicon dots in silica; optoelectronic properties
Elenco autori:
Ossicini, Stefano; Degoli, Elena; Luppi, Marcello; Magri, Rita
Link alla scheda completa:
Titolo del libro:
Optical Properties of Nanocrystals