Data di Pubblicazione:
2001
Citazione:
Surface electronic properties by metastable deexcitation spectroscopy / Nannarone, Stefano; Pasquali, Luca. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - STAMPA. - 182:1-4(2001), pp. 227-234. [10.1016/S0168-583X(01)00680-2]
Abstract:
Metastable deexcitation spectroscopy (MDS) is used to probe the surface electronic properties of semiconductor surfaces and different interfaces with semiconductors. Results are compared to photoemission data and calculations. The following case studies are treated: clean GaAs(110), clean Ge(111)c(2 x 8), Sb/GaAs(110), H:GaAs(110), Yb/GaAs(110), Yb/Si(100) and Ge(111) surface incomplete melting. For each system, MDS spectral features are related to surface valence band (VB) states.
Tipologia CRIS:
Articolo su rivista
Keywords:
metastable deexcitation spectroscopy
Elenco autori:
Nannarone, Stefano; Pasquali, Luca
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