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Degradation based long-term reliability assessment for electronic components in submarine applications

Articolo
Data di Pubblicazione:
2002
Citazione:
Degradation based long-term reliability assessment for electronic components in submarine applications / V., Lista; P., Garbossa; T., Tomasi; Borgarino, Mattia; Fantini, Fausto; L., Gherardi; A., Righetti; M., Villa. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 42:9-11(2002), pp. 1389-1392. [10.1016/S0026-2714(02)00156-7]
Abstract:
Submarine Communication Systems require usage of high-rel components to guarantee long term reliability. A standard reliability assessment, based on observed failures during test, may be achieved only employing a very large number of component-hour, which is often unaffordable. An alternative reliability technique is proposed in this paper, based on the degradation monitoring of the components most relevant electrical parameters, subjected to different test flows. This analysis leads to a quantitative estimate of the components failure rate. (C) 2002 Elsevier Science Ltd. All rights reserved.
Tipologia CRIS:
Articolo su rivista
Keywords:
reliability; degradation monitoring; device
Elenco autori:
V., Lista; P., Garbossa; T., Tomasi; Borgarino, Mattia; Fantini, Fausto; L., Gherardi; A., Righetti; M., Villa
Autori di Ateneo:
BORGARINO Mattia
Link alla scheda completa:
https://iris.unimore.it/handle/11380/309682
Pubblicato in:
MICROELECTRONICS RELIABILITY
Journal
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