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Oxygen vacancy effects on the Schottky barrier height at the Au/TiO2(100) interface: a first principle study

Articolo
Data di Pubblicazione:
2008
Citazione:
Oxygen vacancy effects on the Schottky barrier height at the Au/TiO2(100) interface: a first principle study / Marri, Ivan; Ossicini, Stefano. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - STAMPA. - 147:5-6(2008), pp. 205-207. [10.1016/j.ssc.2008.05.018]
Abstract:
Motivated by the pioneering work of McFarland and Tang on multilayer photovoltaic devices, we discuss here structural and electronic properties of the Au/TiO2(110) interface for a coverage of 1 monolayer (1 ML) of gold, both for a stoichiometric and a reduced (Ti-rich) rutile surface. A detailed analysis of theSchottky barrier height for such systems is presented and the effects generated on this barrier by the presence of an oxygen vacancy (localized on the rutile support) are discussed.
Tipologia CRIS:
Articolo su rivista
Keywords:
Semiconductors; surfaces and interfaces
Elenco autori:
Marri, Ivan; Ossicini, Stefano
Autori di Ateneo:
MARRI Ivan
OSSICINI Stefano
Link alla scheda completa:
https://iris.unimore.it/handle/11380/421710
Pubblicato in:
SOLID STATE COMMUNICATIONS
Journal
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