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First-principle study of ß-AlN thin films on ß-SiC(001)

Articolo
Data di Pubblicazione:
1999
Citazione:
First-principle study of ß-AlN thin films on ß-SiC(001) / R., Di Felice; Bertoni, Carlo Maria; A., Catellani. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 74:(1999), pp. 2137-2139. [10.1063/1.123814]
Abstract:
Abstract: We have investigated the initial stages of formation of cubic AlN films on SiC(001) by studying the energetics of possible structures. We have considered 1X1 and p(4X1) surface reconstructions for the films, and we have allowed for different interface arrangements including atomic mixing. The results of our first-principles calculations reveal that, in N-rich conditions, no two-dimensional film structure is stable. However, in Al-rich conditions, it is possible to stabilize a thick wetting layer of cubic AlN provided the proper interface mixing is achieved. The most stable AlN film exhibits a p(4X1) surface reconstruction. (C) 1999 American Institute of Physics.
Tipologia CRIS:
Articolo su rivista
Keywords:
Electronic structure of surfaces and interfaces of semiconductors. Surface reconstruction and geometry. Ab-initio calculation
Elenco autori:
R., Di Felice; Bertoni, Carlo Maria; A., Catellani
Autori di Ateneo:
BERTONI Carlo Maria
Link alla scheda completa:
https://iris.unimore.it/handle/11380/449096
Pubblicato in:
APPLIED PHYSICS LETTERS
Journal
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