Investigation of information loss mechanisms in EPROMs

Articolo

Data di Pubblicazione:

1983

Citazione:

Investigation of information loss mechanisms in EPROMs / Bertotti, D.; Fantini, Fausto; Morandi, C.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 23:(1983), pp. 717-743. [10.1016/0026-2714(83)91160-3]

Abstract:

The paper reports the results of accelerated life tests on p- and n-channel EPROMs, and compares the indication thus obtained with data from the field.

Tipologia CRIS:

Articolo su rivista

Keywords:

EPROM. Information loss. Accelerated tests. Field data.

Elenco autori:

Bertotti, D.; Fantini, Fausto; Morandi, C.

Link alla scheda completa:

https://iris.unimore.it/handle/11380/451736

Pubblicato in:

MICROELECTRONICS RELIABILITY

Journal