Reliability of compound semiconductor devices

Articolo

Data di Pubblicazione:

1992

Citazione:

Reliability of compound semiconductor devices / Fantini, Fausto; F., Magistrali. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 32:(1992), pp. 1559-1569. [10.1016/0026-2714(92)90456-U]

Abstract:

This paper reviews the reliability of III-V semiconductor devices with particular attention to the failure mechanisms typical of these structures.

Tipologia CRIS:

Articolo su rivista

Keywords:

Reliability. MESFET. Optical devices.

Elenco autori:

Fantini, Fausto; F., Magistrali

Link alla scheda completa:

https://iris.unimore.it/handle/11380/451787

Pubblicato in:

MICROELECTRONICS RELIABILITY

Journal