Data di Pubblicazione:
1983
Citazione:
Updating of CMOS reliability / P., Brambilla; Fantini, Fausto; G., Mattana. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 23:(1983), pp. 761-765. [10.1016/0026-2714(83)91162-7]
Abstract:
Updated results of massive life tests on CMOS are reported. The failure rate derived from laboratory conditions is extrapolated for long life use and compared with field results. Failure mechanism distribution is also reported.
Tipologia CRIS:
Articolo su rivista
Keywords:
Reliability
CMOS.
Elenco autori:
P., Brambilla; Fantini, Fausto; G., Mattana
Link alla scheda completa:
Pubblicato in: