Skip to Main Content (Press Enter)

Logo UNIMORE
  • ×
  • Home
  • Corsi
  • Insegnamenti
  • Professioni
  • Persone
  • Pubblicazioni
  • Strutture
  • Terza Missione
  • Attività
  • Competenze

UNI-FIND
Logo UNIMORE

|

UNI-FIND

unimore.it
  • ×
  • Home
  • Corsi
  • Insegnamenti
  • Professioni
  • Persone
  • Pubblicazioni
  • Strutture
  • Terza Missione
  • Attività
  • Competenze
  1. Pubblicazioni

Monte Carlo simulation of electron transport in Si/SiO2 superlattices

Contributo in Atti di convegno
Data di Pubblicazione:
2002
Citazione:
Monte Carlo simulation of electron transport in Si/SiO2 superlattices / Rosini, Marcello; Jacoboni, Carlo; Ossicini, Stefano. - STAMPA. - 4808:(2002), pp. 170-179. ( Optical Properties of Nanocrystals Seattle, WA, usa 9 July 2002 through 11 July 2002) [10.1117/12.452215].
Abstract:
ABSTRACT In this work we investigate the transport properties of Si/SiO2 superlattices with a multiband one-particle Monte Carlo simulator. The band structure of the system is obtained analytically by solving the Kronig-Penney potential in a tight binding approximation along the growth direction z while we have assumed parabolic dispersion in the in-plane directions. We have introduced in the simulator confined optical phonons, both polar and non polar, as scattering mechanisms. Owing to the very flat shape of the bands along the growth direction, very low drift velocities are obtained for vertical transport. However it turns out that for oblique fields, the in-plane component of the electric field strongly influences the transport properties along the vertical direction as effect of carrier heating. In particular higher vertical drift velocities can be obtained.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
Transport in nanostructures; MonteCarlo methods
Elenco autori:
Rosini, Marcello; Jacoboni, Carlo; Ossicini, Stefano
Autori di Ateneo:
JACOBONI Carlo
OSSICINI Stefano
Link alla scheda completa:
https://iris.unimore.it/handle/11380/459086
Titolo del libro:
N/A
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
  • Utilizzo dei cookie

Realizzato con VIVO | Designed by Cineca | 26.5.0.0