Data di Pubblicazione:
2006
Citazione:
The Fe/NiO interface studied by polarization dependent X – ray absorption spectroscopy / S., Colonna; P., Luches; Valeri, Sergio; F., Boscherini. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - STAMPA. - 246:1(2006), pp. 131-135. [10.1016/j.nimb.2005.12.025]
Abstract:
In order to provide a structural basis for the modelling of the electronic and magnetic properties of the Fe/NiO(001) interface we haveperformed polarization dependent Fe K-edge X-ray absorption measurements. A multi-shell fit of the data is presented and discussed.We find that a 2 ML Fe film exhibits a complete tetragonal distortion of the unit cell and demonstrate the formation of a planar FeOlayer with expanded Fe–O distances perpendicular to the growth plane. We discuss a model for the interface with the FeO layer at theoxide–metal interface. At 10 ML thickness the tetragonal strain of the Fe film is partially released._ 2005 Elsevier B.V. All rights reserved.
Tipologia CRIS:
Articolo su rivista
Keywords:
Fe/NiO interface; X-ray absorption spectroscopy
Elenco autori:
S., Colonna; P., Luches; Valeri, Sergio; F., Boscherini
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