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  1. Pubblicazioni

Assessment of Different OPC UA Industrial IoT solutions for Distributed Measurement Applications

Contributo in Atti di convegno
Data di Pubblicazione:
2020
Citazione:
Assessment of Different OPC UA Industrial IoT solutions for Distributed Measurement Applications / Morato, A.; Vitturi, S.; Tramarin, F.; Cenedese, A.. - (2020), pp. 1-6. ( 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020 Dubrovnik, CROATIA MAY 25-28, 2020) [10.1109/I2MTC43012.2020.9129474].
Abstract:
The Industrial IoT scenario represents an interesting opportunity for distributed measurements systems, that are typically based on efficient and reliable communication systems, as well as the widespread availability of data from measurement instruments and/or sensors. The Open Platform Communications (OPC) Unified Architecture (UA) protocol is designed to ensure interoperability between heterogeneous sensors and acquisition systems, given its object-oriented structure allowing a complete contextualization of the information. Stemming from the intrinsic complexity of OPC UA, we designed an experimental measurement setup to carry out a meaningful performance assessment of its main open source implementations. The aim is to characterize the impact of the adoption of this protocol stack in a DMS in terms of both latency and power consumption, and to provide a general yet accurate and reproducible measurement setup.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
Distributed Measurement Applications; Industrial Internet of Things; OPC UA; Performance evaluation
Elenco autori:
Morato, A.; Vitturi, S.; Tramarin, F.; Cenedese, A.
Autori di Ateneo:
Tramarin Federico
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1210052
Titolo del libro:
I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings
Pubblicato in:
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Journal
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Series
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