The application of off-axis electron holography to electrically biased single GaN nanowires for electrical resistivity measurements
Articolo
Data di Pubblicazione:
2013
Citazione:
The application of off-axis electron holography to electrically biased single GaN nanowires for electrical resistivity measurements / Yazdi, S; Kasama, T; Beleggia, M; Chiechonski, C; Kryliouk, O; Wagner, J. - In: MICROSCOPY AND MICROANALYSIS. - ISSN 1435-8115. - 19:S2(2013), pp. 1502-1503. [10.1017/S1431927613009501]
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Articolo su rivista
Elenco autori:
Yazdi, S; Kasama, T; Beleggia, M; Chiechonski, C; Kryliouk, O; Wagner, J
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