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Flexible InGaZnO TFTs With f(max) Above 300 MHz

Articolo
Data di Pubblicazione:
2018
Citazione:
Flexible InGaZnO TFTs With f(max) Above 300 MHz / Münzenrieder, N; Ishida, K; Meister, T; Cantarella, G; Petti, L; Carta, C; Ellinger, F; Troster, G. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - 39:9(2018), pp. 1310-1313. [10.1109/LED.2018.2854362]
Abstract:
In this letter, the AC performance and influence of bending on flexible IGZO thin-film transistors, exhibiting a maximum oscillation frequency (maximum power gain frequency) f(max) beyond 300 MHz, are presented. Self-alignment was used to realize TFTs with channel length down to 0.5 mu m. The layout of these TFTs was optimized for good AC performance. Besides the channel dimensions, this includes ground-signal-ground contact pads. The AC performance of these short channel devices was evaluated by measuring their two port scattering parameters. These measurements were used to extract the unity gain power frequency from the maximum stable gain and the unilateral gain. The two complimentary definitions result in f max values of (304 +/- 12) and (398 +/- 53) MHz, respectively. Furthermore, the transistor performance is not significantly altered by mechanical strain. Here, f(max) reduces by 3.6% when a TFT is bent to a tensile radius of 3.5 mm.
Tipologia CRIS:
Articolo su rivista
Keywords:
Thin-film transistors; Flexible electronics; IGZO; maximum oscillation frequency
Elenco autori:
Münzenrieder, N; Ishida, K; Meister, T; Cantarella, G; Petti, L; Carta, C; Ellinger, F; Troster, G
Autori di Ateneo:
CANTARELLA Giuseppe
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1290889
Pubblicato in:
IEEE ELECTRON DEVICE LETTERS
Journal
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