Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques

Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques / Asanovski, Ruben; Franco, Jacopo; Palestri, Pierpaolo; Kaczer, Ben; Selmi, Luca. - In: SOLID-STATE ELECTRONICS. - ISSN 0038-1101. - 207:(2023), pp. 1-5. [10.1016/j.sse.2023.108722]