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  1. Pubblicazioni

Absolute spectral response measurements of different photodiodes useful for applications in the UV spectral region

Contributo in Atti di convegno
Data di Pubblicazione:
2004
Citazione:
Absolute spectral response measurements of different photodiodes useful for applications in the UV spectral region / Pelizzo, Mg; Ceccherini, P; Garoli, D; Masut, P; Nicolosi, P. - 5529:(2004), pp. 285-293. ( Proceedings of SPIE - The International Society for Optical Engineering. In Nonimaging Optics and Efficient Illumination Systems Denver, CO, usa 2004) [10.1117/12.568201].
Abstract:
Long UV radiation exposure can result in damages of biological tissues, as burns, skin aging, erythema and even melanoma cancer. In the past years an increase of melanoma cancer has been observed and associated to the atmospheric ozone deployment. Attendance of sun tanning unit centers has become a huge social phenomena, and the maximum UV radiation dose that a human being can receive is regulated by law. On the other side, UV radiation is largely used for therapeutic and germicidal purposes. In all these areas, spectroradiometer and radiomenter are needed for monitoring UVA (lambda = 315-400 nm), UVB (lambda = 280-315 nm) and UVC (lambda=100-280 nm) irradiance. We have selected some commercial photodiodes which can be used as solid state detectors in these instruments. We have characterized them by measuring their absolute spectral response in the 200 - 400 nm spectral range.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
photodiode; ultraviolet; radiometer
Elenco autori:
Pelizzo, Mg; Ceccherini, P; Garoli, D; Masut, P; Nicolosi, P
Autori di Ateneo:
GAROLI Denis
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1315947
Titolo del libro:
Proceedings of SPIE - The International Society for Optical Engineering. In Nonimaging Optics and Efficient Illumination Systems
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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