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EUV Polarimetry with single multilayer optical elementProceedings of SPIE

Contributo in Atti di convegno
Data di Pubblicazione:
2008
Citazione:
EUV Polarimetry with single multilayer optical elementProceedings of SPIE / Sara, Zuccon; Maria Guglielmina, Pelizzo; P., Nicolosi; A., Giglia; N., Mahne; Nannarone, Stefano. - STAMPA. - 7077:(2008), pp. 70771R-70771R-13. ( 3rd Conference on Advances in X-Ray/EUV Optics and Components San Diego, CA, usa AUG 11-13, 2008) [10.1117/12.791907].
Abstract:
A polarimetric measurement technique based on the analysis of the reflection data given by a single mirror rotated around the incidence beam axis is presented. In the extreme ultraviolet spectral region, a multilayer coated mirror must be used. The multilayer mirror must be fully characterized before the experiment. Theory demonstrates how this method allows complete determination of Stoke's parameters in case of a totally polarized beam. A simulation code has been developed in order to model the experiment in case of synchrotron radiation propagating in a bending magnet beamline and impinging a multilayer mirror. The simulation is useful to verify each time the effectiveness of the method in the different experimental conditions considered. Finally an experimental application is presented.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
EUV; Polarimetry; Stokes; Synchrotron radiation;
Elenco autori:
Sara, Zuccon; Maria Guglielmina, Pelizzo; P., Nicolosi; A., Giglia; N., Mahne; Nannarone, Stefano
Link alla scheda completa:
https://iris.unimore.it/handle/11380/743040
Titolo del libro:
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS III
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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