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Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayerProceedings of SPIE

Contributo in Atti di convegno
Data di Pubblicazione:
2007
Citazione:
Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayerProceedings of SPIE / Nicola, Mahne; Angelo, Giglia; Nannarone, Stefano; Juri, Bertoli; Valentina, Mattarello; Valentino, Rigato. - STAMPA. - 6586:(2007), pp. 65860V-65860V+0. ( Conference on Damage to VUV, EUV and X-Ray Optics Prague, cze APR 18-19, 2007) [10.1117/12.722922].
Abstract:
The performance of multilayer optics depends on the quality of interfaces between spacer and absorber materials. Intermixing at the interfaces affects the optical behavior. An experimental method is presented here to obtain the amount of intermixing at the buried interfaces of multilayer structures. The method is based on the combined use of photoemission and a rocking scan through the Bragg peak. The possibility of obtaining quantitative information - through a phenomenological model - on the width of the intermixing region is presented and discussed.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
buried interfaces
Elenco autori:
Nicola, Mahne; Angelo, Giglia; Nannarone, Stefano; Juri, Bertoli; Valentina, Mattarello; Valentino, Rigato
Link alla scheda completa:
https://iris.unimore.it/handle/11380/743052
Titolo del libro:
DAMAGE TO VUV, EUV, AND X-RAY OPTICS
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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