Real-space determination of atomic structure and bond relaxation at the NiSi2-Si(111) interface

The atomic structure at the interface of a 180° rotated single-crystal NiSi2 film on Si(111) has been determined by a new thin-film ion-channeling method, using ultrahigh depth resolution. The Ni atoms at the interface are found to be sevenfold coordinated. The bonds across the interface are slightly contracted.