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  1. Research Outputs

Pin–hole contact with curvature-induced couple tractions in couple-stress elasticity

Academic Article
Publication Date:
2026
Short description:
Pin–hole contact with curvature-induced couple tractions in couple-stress elasticity / Radi, E., Güler, M.A.. - In: INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES. - ISSN 0020-7683. - 339:(2026), pp. 1-13. [10.1016/j.ijsolstr.2026.114121]
abstract:
In this study, a curvature-compatible formulation is presented for the frictionless contact between a rigid pin and a circular hole in a microstructured elastic plane governed by constrained couple-stress theory under plane-strain conditions. Unlike the classical micro-free assumption, the present model allows transmission of couple tractions across the contact interface and imposes a uniform tangential curvature, consistent with the pin-hole geometry.
The boundary value problem is expressed through trigonometric expansions in polar coordinates, yielding a coupled system of dual series equations that is reduced to an infinite algebraic system and solved by truncation. The effect of transmitted couple tractions on the contact half-angle and on the stress and couple-stress fields along the hole boundary is quantified. The results show that curvature compatibility significantly modifies the near boundary response and leads to a more uniform stress and couple-stress distribution compared with the microfree case. The formulation provides a consistent extension of pin-hole contact analysis in materials with intrinsic length-scale.
Iris type:
Articolo su rivista
Keywords:
Pin-hole contact; Curvature compatibility; Transmitted couple tractions; Constrained couple-stress elasticity; Coupled dual series equations.
List of contributors:
Radi, E.; Güler, M. A.
Authors of the University:
RADI Enrico
Handle:
https://iris.unimore.it/handle/11380/1408668
Full Text:
https://iris.unimore.it//retrieve/handle/11380/1408668/989582/SAS114121-16%20June.pdf
Published in:
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES
Journal
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URL

https://www.sciencedirect.com/science/article/pii/S0020768326002933?via=ihub
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