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  1. Research Outputs

Decoupling Carrier Concentration and Electron-Phonon Coupling in Oxide Heterostructures Observed with Resonant Inelastic X-Ray Scattering

Academic Article
Publication Date:
2018
Short description:
Decoupling Carrier Concentration and Electron-Phonon Coupling in Oxide Heterostructures Observed with Resonant Inelastic X-Ray Scattering / Meyers, D., Nakatsukasa, K., Mu, S., Hao, L., Yang, J., Cao, Y., Fabbris, G., Miao, H.u., Pelliciari, J., Mcnally, D., Dantz, M., Paris, E., Karapetrova, E., Choi, Y., Haskel, D., Shafer, P., Arenholz, E., Schmitt, T., Berlijn, T., Johnston, S., et al.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 121:23(2018), pp. 1-5. [10.1103/physrevlett.121.236802]
abstract:
We report the observation of multiple phonon satellite features in ultrathin superlattices of the form nSrIrO3/mSrTiO3 using resonant inelastic x-ray scattering (RIXS). As the values of n and m vary, the energy loss spectra show a systematic evolution in the relative intensity of the phonon satellites. Using a closed-form solution for the RIXS cross section, we extract the variation in the electron-phonon coupling strength as a function of n and m. Combined with the negligible carrier doping into the SrTiO3 layers, these results indicate that the tuning of the electron-phonon coupling can be effectively decoupled from doping. This work both showcases a feasible method to extract the electron-phonon coupling in superlattices and unveils a potential route for tuning this coupling, which is often associated with superconductivity in SrTiO3-based systems.
Iris type:
Articolo su rivista
List of contributors:
Meyers, D.; Nakatsukasa, Ken; Mu, Sai; Hao, Lin; Yang, Junyi; Cao, Yue; Fabbris, G.; Miao, Hu; Pelliciari, J.; Mcnally, D.; Dantz, M.; Paris, E.; Karapetrova, E.; Choi, Yongseong; Haskel, D.; Shafer, P.; Arenholz, E.; Schmitt, Thorsten; Berlijn, Tom; Johnston, S.; Liu, Jian; Dean, M.  p.  m.
Authors of the University:
Pelliciari Jonathan
Handle:
https://iris.unimore.it/handle/11380/1410556
Published in:
PHYSICAL REVIEW LETTERS
Journal
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