In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth

Articolo
Data di Pubblicazione:
2006
Citazione:
In situ X-ray synchrotron study of organic semiconductor ultra-thin films growth / J. F., Moulin; F., Dinelli; M., Massi; C., Albonetti; R., Kshirsagar; Biscarini, Fabio. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 246:1(2006), pp. 122-126. [10.1016/j.nimb.2005.12.008]
Tipologia CRIS:
Articolo su rivista
Keywords:
Organic semiconductors; Structure; Thin films; X-ray reflectivity;
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.unimore.it/handle/11380/963166
Pubblicato in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Journal