A new methodology for SEE testing and simulation

Integrated circuits for space application are tested at accelerators for their susceptibility to Single Event Effects. The high cost and the limited avaliability associated with accelerators testing suggest the development of new low cost techniques. Pulsed laser provides results that can be correlated with ion test results (despite the different physical interaction between semiconductor and ion or laser) and also temporal and spatial information of SEEs. CAD simulators are always used in design and they can be exploited at early stages of the project to accomplish a "smart test" procedure. This new testing methodology overcomes some limitations of laser testing: by coupling a laser equipment with a software simulator and CAD tools, an economic equipment for reliable SEE testing is obtained.