Controlled manipulation of thiol-functionalised gold nanoparticles on Si(100) by Dynamic Force microscopy

Mechanical control of nanometer size objects and the dynamic behaviour at thislength scale are subjects of growing interest. One promising approach to operate and performquantitative measurements in this regime is to use dissipation processes in atomic forcemicroscopy. We obtained a controlled manipulation of thiol-functionalised gold nanoparticleson silicon dioxide and a measurements of the energy depinning threshold as a function ofnanoparticles characteristics by using the AFM microscope in a particular dynamic regime.Detailed procedure and preliminary results will be described in this contribution.