Data di Pubblicazione:
2018
Citazione:
Combined HREM and theoretical analysis of SiC/Si interfaces / Grillo, V., Frabboni, S., Cicero, G., Savini, G., Catellani, A. - In: Microscopy of Semiconducting Materials 2003[s.l] : CRC Press, 2018. - ISBN 9781351074636. - pp. 69-72 [10.1201/9781351074636]
Abstract:
We performed molecular dynamics simulations to study the atomic structure of the β-SiC/Si(001) and (111) interfaces. The wide lattice mismatch between the two materials (?20%) introduces an array of misfit dislocations along the interface, responsible for releasing almost all the strain which would be present in a pseudomorphic structure. The interface termination, its stoichiometry and the core dislocation structures are discussed here; for the most stable heterostructures, the simulated HREM images are presented, and the features connected to the peculiar interface reconstructions shown.
Tipologia CRIS:
Capitolo/Saggio
Elenco autori:
Grillo, V.; Frabboni, S.; Cicero, G.; Savini, G.; Catellani, A.
Link alla scheda completa:
Titolo del libro:
Microscopy of Semiconducting Materials 2003