Introduction to the Special Issue on Nonvolatile Memory Reliability, IEEE Transactions on Device and Materials Reliability
Edited Book
Publication Date:
2004
Short description:
Introduction to the Special Issue on Nonvolatile Memory Reliability, IEEE Transactions on Device and Materials Reliability / P., Cappelletti; Pavan, Paolo. - STAMPA. - (2004), pp. 299-300.
abstract:
This Special Issue of the IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY is intended to give a com- prehensive picture of the state-of-the-art in the field of non- volatile memories. It is an important opportunity for the NVM technical community to document their progress, reporting on recent achievements and future challenges.
Iris type:
Curatela
Keywords:
Flash Memories; reliability; nonvolatile memoreis
List of contributors: