Publication Date:
2023
Short description:
Assessing risk of bias and applicability / Reitsma, J.B., Rutjes, A.W.S., Whiting, P., Yang, B., Leeflang, M.M., Bossuyt, P.M., Deeks, J.J. - In: Assessing risk of bias and applicability[s.l] : John Wiley and Sons Ltd., 2023. - ISBN 9781119756194. - pp. 169-201 [10.1002/9781119756194.ch8]
Iris type:
Capitolo/Saggio
Keywords:
Applicability judgements; Comparative accuracy studies; Index test; Participant selection; QUADAS-2 tool; Quality assessment tools; Reference standard; Risk of bias; Test accuracy studies;
List of contributors:
Reitsma, J. B.; Rutjes, Anne Wilhelmina Saskia; Whiting, P.; Yang, B.; Leeflang, M. M.; Bossuyt, P. M.; Deeks, J. J.
Book title:
Assessing risk of bias and applicability