Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope
Academic Article
Publication Date:
2024
Short description:
Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope / Tavabi, A. H.; Rosi, P.; Ravelli, R. B. G.; Gijsbers, A.; Rotunno, E.; Guner, T.; Zhang, Y.; Roncaglia, A.; Belsito, L.; Pozzi, G.; Denneulin, T.; Gazzadi, G. C.; Ghosh, M.; Nijland, R.; Frabboni, S.; Peters, P. J.; Karimi, E.; Tiemeijer, P.; Dunin-Borkowski, R. E.; Grillo, V.. - In: PHYSICAL REVIEW APPLIED. - ISSN 2331-7019. - 22:1(2024), pp. 1-9. [10.1103/PhysRevApplied.22.014083]
Iris type:
Articolo su rivista
List of contributors:
Tavabi, A. H.; Rosi, P.; Ravelli, R. B. G.; Gijsbers, A.; Rotunno, E.; Guner, T.; Zhang, Y.; Roncaglia, A.; Belsito, L.; Pozzi, G.; Denneulin, T.; Gazzadi, G. C.; Ghosh, M.; Nijland, R.; Frabboni, S.; Peters, P. J.; Karimi, E.; Tiemeijer, P.; Dunin-Borkowski, R. E.; Grillo, V.
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