Measuring magnetic profiles at manganite surfaces with monolayer resolution

The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic "dead layer" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra synchrotron, Trieste). Measurements were carried out in specular reflectivity geometry, switching the left/right elliptical polarization of light as well as the magnetization direction in the scattering plane. Spectra were collected across the Mn L 2,3 edge for at least four different grazing angles to better analyse the interference phenomena. The resulting reflectivity spectra have been carefully fit to obtain the magnetization profiles, minimizing the number of free parameters as much as possible. Optical constants of the samples (real and imaginary part of the refractive index) in the interested frequency range are obtained through absorption measurements in two magnetization states and subsequent Kramers-Krönig transformation, allowing quantitative fits of the magnetization profile at different temperatures. We apply this method to the study of air-exposed surfaces of epitaxial La 2/3Sr 1/3MnO 3 (0 0 1) films grown on SrTiO 3 (0 0 1) substrates.