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Morphology, Stoichiometry, and Interface Structure of CeO2 Ultrathin Films on Pt(111)

Articolo
Data di Pubblicazione:
2011
Citazione:
Morphology, Stoichiometry, and Interface Structure of CeO2 Ultrathin Films on Pt(111) / Luches, P.; Pagliuca, F.; Valeri, Sergio. - In: JOURNAL OF PHYSICAL CHEMISTRY. C. - ISSN 1932-7447. - STAMPA. - 115:21(2011), pp. 10718-10726. [10.1021/jp201139y]
Abstract:
Studies of model systems based on cerium oxide are important to improve current understanding of the properties of ceria-based materials, which find wide application based on the ability of cerium oxide to store, release, and transport oxygen. We report a study of CeO2 ultrathin films grown on the Pt(111) surface by reactive deposition of Ce using molecular or atomic oxygen as the oxidizing gas. High-temperature treatments in O-2 allowed us to obtain epitaxial structures with a very good quality in terms of morphology, stoichiometry, and structure. The cerium oxide films have a very flat morphology with terraces several tens of nanometers wide. The stoichiometry of the films is mainly CeO2, and the concentration of Ce3+ ions in the film can be reversibly increased by temperature treatments. We propose that the Pt substrate oxidation has a determinant role for the epitaxial stabilization of ceria films.
Tipologia CRIS:
Articolo su rivista
Keywords:
Cerium oxide; ultrathin films; interface structure; morphology; stoichiometry.
Elenco autori:
Luches, P.; Pagliuca, F.; Valeri, Sergio
Autori di Ateneo:
VALERI Sergio
Link alla scheda completa:
https://iris.unimore.it/handle/11380/763289
Pubblicato in:
JOURNAL OF PHYSICAL CHEMISTRY. C
Journal
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