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  1. Pubblicazioni

Effects of the density and homogeneity in NIRS crop moisture estimation

Contributo in Atti di convegno
Data di Pubblicazione:
2017
Citazione:
Effects of the density and homogeneity in NIRS crop moisture estimation / Lenzini, Nicola; Rovati, Luigi; Ferrari, Luca. - 10329:(2017), p. 103294O. ( Optical Measurement Systems for Industrial Inspection X 2017 deu 2017) [10.1117/12.2272443].
Abstract:
Near-infrared spectroscopy (NIRS) is widely used in fruits and vegetables quality evaluation. This technique is also used for the analysis of alfalfa, a crop that occupies a position of great importance in the agricultural field. In particular for the storage, moisture content is a key parameter for the crops and for this reason its monitoring is very important during the harvesting phase. Usually optical methods like NIRS are well suitable in laboratory frameworks where the specimen is properly prepared, while their application during the harvesting phase presents several diffculties. A lot of influencing factors, such as density and degree of homogeneity can affect the moisture evaluation. In this paper we present the NIRS analysis of alfalfa specimens with different values of moisture and density, as well as the obtained results. To study scattering and absorption phenomena, the forward and backward scattered light from the sample have been spectrally analyzed.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
alfalfa; density; moisture; NIR Spectroscopy; Electronic, Optical and Magnetic Materials; Condensed Matter Physics; Computer Science Applications1707 Computer Vision and Pattern Recognition; Applied Mathematics; Electrical and Electronic Engineering
Elenco autori:
Lenzini, Nicola; Rovati, Luigi; Ferrari, Luca
Autori di Ateneo:
ROVATI Luigi
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1153557
Titolo del libro:
Proceedings of SPIE - The International Society for Optical Engineering
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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