Special Issue of IEEE Transactions on Semiconductor Manufacturing devoted to the 2011 International Conference on Microelectronic Test Structures

Curatela
Data di Pubblicazione:
2012
Citazione:
Special Issue of IEEE Transactions on Semiconductor Manufacturing devoted to the 2011 International Conference on Microelectronic Test Structures / Selmi, Luca. - In: IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. - ISSN 0894-6507. - (2012), pp. 541-541.
Tipologia CRIS:
Curatela
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1162741
Pubblicato in:
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
Journal