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Research Outputs
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
Journal
Identifier:
E079955
ISSN:
0894-6507
Overview
Overview
Research Outputs (3)
Dependability Assessment of Transfer Length Method to Extract the Metal–Graphene Contact Resistance
Academic Article
Impact of Device Layout and Annealing Process During the Passivation of Interface States in Presence of Silicon Nitride Layers
Academic Article
Special Issue of IEEE Transactions on Semiconductor Manufacturing devoted to the 2011 International Conference on Microelectronic Test Structures
Edited Book
No Results Found
