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On the Adequacy of the Transmission Line Model to Describe the Graphene-Metal Contact Resistance

Articolo
Data di Pubblicazione:
2018
Citazione:
On the Adequacy of the Transmission Line Model to Describe the Graphene-Metal Contact Resistance / Venica, Stefano; Driussi, Francesco; Gahoi, Amit; Palestri, Pierpaolo; Lemme, Max C.; Selmi, Luca. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - ELETTRONICO. - 65:4(2018), pp. 1589-1596. [10.1109/TED.2018.2802946]
Abstract:
The contact-end-resistance (CER) method is applied to transfer length method structures to characterize in-depth the graphene-metal contact and its dependence on the back-gate bias. Parameters describing the graphene-metal stack resistance are extracted through the widely used transmission line model. The results show inconsistencies which highlight application limits of the model underlying the extraction method. These limits are attributed to the additional resistance associated with the p-p+ junction located at the contact edge, that is not part of the conventional transmission line model. Useful guidelines for a correct application of the extraction technique are provided, identifying the bias range in which this additional resistance is negligible. Finally, the CER method and the transmission line model are exploited to characterize the graphene-metal contacts featuring different metals. © 2012 IEEE.
Tipologia CRIS:
Articolo su rivista
Keywords:
Contact-end-resistance (CER) method; graphene-field-effect transistor (GFET); transfer length method (TLM); transmission line model.; Electronic; Optical and Magnetic Materials; Electrical and Electronic Engineering
Elenco autori:
Venica, Stefano; Driussi, Francesco; Gahoi, Amit; Palestri, Pierpaolo; Lemme, Max C.; Selmi, Luca
Autori di Ateneo:
PALESTRI Pierpaolo
SELMI LUCA
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1163285
Link al Full Text:
https://iris.unimore.it//retrieve/handle/11380/1163285/839994/TED_experimentsContactRes.pdf
Pubblicato in:
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal
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URL

http://ieeexplore.ieee.org/document/8299548/
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