Flexible CMOS electronics based on p-type Ge2Sb2Te5 and n-type InGaZnO4 semiconductors
Contributo in Atti di convegno
Data di Pubblicazione:
2018
Citazione:
Flexible CMOS electronics based on p-type Ge2Sb2Te5 and n-type InGaZnO4 semiconductors / Daus, A.; Han, S.; Knobelspies, S.; Cantarella, G.; Vogt, C.; Munzenrieder, N.; Troster, G.. - (2018), pp. 8.1.1-8.1.4. ( 63rd IEEE International Electron Devices Meeting, IEDM 2017 usa 2017) [10.1109/IEDM.2017.8268349].
Abstract:
Ultra-thin p-type chalcogenide glass Ge2Sb2Te5 (GST) semiconductor layers are employed to form flexible thin-film transistors (TFTs). For the first time, TFTs based on GST show saturating output characteristics and an ON/OFF ratio up to 388, exceeding present reports by a factor of ∼20. The channel current modulation is greatly enhanced by using ultra-thin 5 nm thick amorphous GST layers and 20 nm thick high-k Al2O3 gate dielectrics. Flexible CMOS circuits are realized in combination with the n-type oxide semiconductor InGaZnO4 (IGZO). The CMOS inverters show voltage gain of up to 69. Furthermore, flexible NAND gates are presented. The bending stability is shown for a tensile radius of 6 mm. U.S. Government work not protected by U.S.
Tipologia CRIS:
Relazione in Atti di Convegno
Elenco autori:
Daus, A.; Han, S.; Knobelspies, S.; Cantarella, G.; Vogt, C.; Munzenrieder, N.; Troster, G.
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Titolo del libro:
Technical Digest - International Electron Devices Meeting, IEDM
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