AC Performance Tunability of Flexible Bottom-Gate InGaZnO TFTs by an Additional Top-Gate Contact
Articolo
Data di Pubblicazione:
2023
Citazione:
AC Performance Tunability of Flexible Bottom-Gate InGaZnO TFTs by an Additional Top-Gate Contact / Catania, F.; Khaanghah, N. S.; Corsino, D.; Oliveira, H. D. S.; Carrasco-Pena, A.; Ishida, K.; Meister, T.; Ellinger, F.; Cantarella, G.; Munzenrieder, N.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 70:12(2023), pp. 6359-6363. [10.1109/TED.2023.3323914]
Abstract:
This study explores the performance tuning of flexible InGaZnO (IGZO) thin-film transistors (TFTs) using a double-gate configuration. DC analysis on individually controllable double-gate TFTs highlights that the bottom-gate biasing is highly effective in facilitating efficient switching of the devices, whereas the top-gate biasing allows for controlling their performance. This is demonstrated for the ac response of the devices with different channel lengths showing the tunability of $\textit{f}_{\,\text{T}}$ and $\textit{f}_{\,\text{MAX}}$ with a maximum relative tuning up to 130% for $\textit{f}_{\,\text{T}}$ and 170% for $\textit{f}_{\,\text{MAX}}$ . A more efficient control is observed for longer TFTs, resulting in increased characteristics frequency up to 50%. Furthermore, the effect of the performance tunability is also reported even when the double-gate TFTs are exposed to tensile strain induced by a bending radius of 2 mm. These findings indicate new possibilities for the design of flexible analog systems with dynamically adjustable performance.
Tipologia CRIS:
Articolo su rivista
Keywords:
Current measurement; Double-gate thin-film transistors (TFTs); flexible electronics; InGaZnO (IGZO); Logic gates; Performance evaluation; Semiconductor device measurement; TFTs; Thin film transistors; Threshold voltage; transit frequency; Voltage measurement
Elenco autori:
Catania, F.; Khaanghah, N. S.; Corsino, D.; Oliveira, H. D. S.; Carrasco-Pena, A.; Ishida, K.; Meister, T.; Ellinger, F.; Cantarella, G.; Munzenrieder, N.
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