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PFM2: A 32 × 32 processor for X-ray diffraction imaging at FELs

Articolo
Data di Pubblicazione:
2016
Citazione:
PFM2: A 32 × 32 processor for X-ray diffraction imaging at FELs / Manghisoni, M.; Fabris, L.; Re, V.; Traversi, G.; Ratti, L.; Grassi, M.; Lodola, L.; Malcovati, P.; Vacchi, C.; Pancheri, L.; Benkechcache, M. E. A.; Betta, G. F. Dalla; Xu, H.; Verzellesi, Giovanni; Ronchin, S.; Boscardin, M.; Batignani, G.; Bettarini, S.; Casarosa, G.; Forti, F.; Giorgi, M.; Paladino, A.; Paoloni, E.; Rizzo, G.; Morsani, F.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 11:11(2016), pp. C11033-C11033. [10.1088/1748-0221/11/11/C11033]
Abstract:
This work is concerned with the design of a readout chip for application to experiments at the next generation X-ray Free Electron Lasers (FEL). The ASIC, named PixFEL Matrix (PFM2), has been designed in a 65 nm CMOS technology and consists of 32 × 32 pixels. Each cell covers an area of 110 × 110 μm2 and includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, a time-variant shaper used to process the preamplifier output signal, a 10-bit successive approximation register (SAR) analog-to-digital converter (ADC) and digital circuitry for channel control and data readout. Two different solutions for the readout channel, based on different versions of the time-variant filter, have been integrated in the chip. Both solutions can be operated in such a way to cope with the high frame rate (exceeding 1 MHz) foreseen for future X-ray FEL machines. The ASIC will be bump bonded to a slim/active edge pixel sensor to form the first demonstrator for the PixFEL X-ray imager. This work has been carried out in the frame of the PixFEL project funded by Istituto Nazionale di Fisica Nucleare (INFN), Italy.
Tipologia CRIS:
Articolo su rivista
Keywords:
Front-end electronics for detector readout; Instrumentation for FEL; Instrumentation; Mathematical Physics
Elenco autori:
Manghisoni, M.; Fabris, L.; Re, V.; Traversi, G.; Ratti, L.; Grassi, M.; Lodola, L.; Malcovati, P.; Vacchi, C.; Pancheri, L.; Benkechcache, M. E. A.; Betta, G. F. Dalla; Xu, H.; Verzellesi, Giovanni; Ronchin, S.; Boscardin, M.; Batignani, G.; Bettarini, S.; Casarosa, G.; Forti, F.; Giorgi, M.; Paladino, A.; Paoloni, E.; Rizzo, G.; Morsani, F.
Autori di Ateneo:
VERZELLESI Giovanni
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1134911
Pubblicato in:
JOURNAL OF INSTRUMENTATION
Journal
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URL

http://iopscience.iop.org/article/10.1088/1748-0221/11/11/C11033/pdf
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