Tailoring spectral position and width of field enhancement by focused ion-beam patterning of plasmonic nanoparticles
Articolo
Data di Pubblicazione:
2010
Citazione:
Tailoring spectral position and width of field enhancement by focused ion-beam patterning of plasmonic nanoparticles / Rosa, L., Sun, K., Szymanska, J., Hudson Fay, E., Dzurak, A., Linden, A., Bauerdick, S., Peto, L., Juodkazis, S.. - In: PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS. - ISSN 1862-6254. - 4:10(2010), pp. 262-264. [10.1002/pssr.201004239]
Abstract:
We propose to use ion-beam patterning of plasmonic nanoparticles made by standard electron beam lithography, plasmonic metal deposition, and lift-off sequence. With this approach new three-dimensional (3D) tailoring of nanoparticles becomes possible: cut through the particle and into the substrate, cut-through at an angle, trim or bore nanoparticles or substrate. Here, we numerically simulate the expected optical properties of such 3D patterned nanoparticles. We show a particular case when spectrally broad extinction band can be created with a strong light field enhancement on a Si substrate. [GRAPHICS] Nanoparticles with a 10-20 nm nano-gap cut by ion-beam at the chosen location and to the required depth into the substrate. Scanning electron microscopy (SEM) image of the fabricated Au-nanoparticles. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Tipologia CRIS:
Articolo su rivista
Keywords:
Electron beam lithography, Ion beam lithography, Light field enhancement, Nanoparticles, Patterning, Plasmonics
Elenco autori:
Rosa, Lorenzo; Sun, Kai; Szymanska, Joanna; Hudson Fay, E.; Dzurak, Andrew; Linden, Andre; Bauerdick, Sven; Peto, Lloyd; Juodkazis, Saulius
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