Special Issue of IEEE Transactions on Semiconductor Manufacturing devoted to the 2011 International Conference on Microelectronic Test Structures

Edited Book
Publication Date:
2012
Short description:
Special Issue of IEEE Transactions on Semiconductor Manufacturing devoted to the 2011 International Conference on Microelectronic Test Structures / Selmi, L.. - In: IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. - ISSN 0894-6507. - (2012), pp. 541-541.
Iris type:
Curatela
List of contributors:
Authors of the University:
Handle:
https://iris.unimore.it/handle/11380/1162741
Published in:
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
Journal