A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors
Academic Article
Publication Date:
2002
Short description:
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors / Palestri, Pierpaolo; Dalla Serra, Alberto; Selmi, Luca; M., Pavesi; Rigolli, P. L.; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 49:8(2002), pp. 1427-1435. [10.1109/TED.2002.801439]
Iris type:
Articolo su rivista
Keywords:
Anode hole injection (AHI); Monte-Carlo simulation; Oxide reliability; Photon emission; Substrate current;
List of contributors:
Palestri, Pierpaolo; Dalla Serra, Alberto; Selmi, Luca; M., Pavesi; Rigolli, P. L.; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico
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