Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET

Conference Paper

Publication Date:

2006

Short description:

Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET / Ponton, D; Lucci, L; Palestri, Pierpaolo; Esseni, David; Selmi, Luca. - (2006), pp. 166-169. ( ESSDERC 2006 - 36th European Solid-State Device Research Conference Montreux, che 18-22/09/2006) [10.1109/ESSDER.2006.307664].

Iris type:

Relazione in Atti di Convegno

List of contributors:

Ponton, D; Lucci, L; Palestri, Pierpaolo; Esseni, David; Selmi, Luca

Authors of the University:

PALESTRI Pierpaolo

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1163120

Book title:

European Solid-State Device Research Conference (ESSDERC)

Published in:

PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE

Series