Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs

Academic Article

Publication Date:

1994

Short description:

Correlation between Substrate Hot Electron Energy and Homogeneous Degradation in n-MOSFETs / Selmi, Luca; Fiegna, C; Bez, R.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 41:9(1994), pp. 1677-1679. [10.1109/16.310126]

Iris type:

Articolo su rivista

List of contributors:

Selmi, Luca; Fiegna, C; Bez, R.

Authors of the University:

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1163233

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal