Monitoring Hot Carrier Degradation in SOI MOSFETs by Hot Carrier Luminescence Techniques

Academic Article

Publication Date:

1998

Short description:

Monitoring Hot Carrier Degradation in SOI MOSFETs by Hot Carrier Luminescence Techniques / Selmi, Luca; Pavesi, M; Wong, H. S.; Acovic, A; Sangiorgi, Enrico. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 45:5(1998), pp. 1135-1139. [10.1109/16.669568]

Iris type:

Articolo su rivista

List of contributors:

Selmi, Luca; Pavesi, M; Wong, H. S.; Acovic, A; Sangiorgi, Enrico

Authors of the University:

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1163262

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal