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  1. Research Outputs

On the Adequacy of the Transmission Line Model to Describe the Graphene-Metal Contact Resistance

Academic Article
Publication Date:
2018
Short description:
On the Adequacy of the Transmission Line Model to Describe the Graphene-Metal Contact Resistance / Venica, Stefano; Driussi, Francesco; Gahoi, Amit; Palestri, Pierpaolo; Lemme, Max C.; Selmi, Luca. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - ELETTRONICO. - 65:4(2018), pp. 1589-1596. [10.1109/TED.2018.2802946]
abstract:
The contact-end-resistance (CER) method is applied to transfer length method structures to characterize in-depth the graphene-metal contact and its dependence on the back-gate bias. Parameters describing the graphene-metal stack resistance are extracted through the widely used transmission line model. The results show inconsistencies which highlight application limits of the model underlying the extraction method. These limits are attributed to the additional resistance associated with the p-p+ junction located at the contact edge, that is not part of the conventional transmission line model. Useful guidelines for a correct application of the extraction technique are provided, identifying the bias range in which this additional resistance is negligible. Finally, the CER method and the transmission line model are exploited to characterize the graphene-metal contacts featuring different metals. © 2012 IEEE.
Iris type:
Articolo su rivista
Keywords:
Contact-end-resistance (CER) method; graphene-field-effect transistor (GFET); transfer length method (TLM); transmission line model.; Electronic; Optical and Magnetic Materials; Electrical and Electronic Engineering
List of contributors:
Venica, Stefano; Driussi, Francesco; Gahoi, Amit; Palestri, Pierpaolo; Lemme, Max C.; Selmi, Luca
Authors of the University:
PALESTRI Pierpaolo
SELMI LUCA
Handle:
https://iris.unimore.it/handle/11380/1163285
Full Text:
https://iris.unimore.it//retrieve/handle/11380/1163285/839994/TED_experimentsContactRes.pdf
Published in:
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal
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URL

http://ieeexplore.ieee.org/document/8299548/
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